ITU-T - O.174 CORR 2
(Pre-Published) Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology: Corrigendum 2
active, Most Current
| Organization: | ITU-T |
| Publication Date: | 1 February 2012 |
| Status: | active |
| Page Count: | 4 |
scope:
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical layer of synchronous Ethernet systems. A bit error rate test set may be part of the same equipment or may be physically separate.
[ITU-T O.172] specifies the test equipment for generation and measurement of jitter and wander in digital systems based on the synchronous digital hierarchy (SDH).
[ITU-T G.8261], [ITU-T G.8262] and [ITU-T G.8264] should be read in conjunction with this Recommendation.
Document History
O.174 CORR 2
February 1, 2012
(Pre-Published) Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology: Corrigendum 2
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...
April 1, 2011
(Pre-Published) Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology Amendment 1
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...
July 1, 2010
Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology Corrigendum 1
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...
November 1, 2009
Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...