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JEDEC JESD 435

Standard for the Measurement of Small-Signal Transistor Scattering Parameters

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Organization: JEDEC
Publication Date: 1 April 1976
Status: active
Page Count: 29
scope:

PREFACE

The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC.

Document History

JEDEC JESD 435
April 1, 1976
Standard for the Measurement of Small-Signal Transistor Scattering Parameters
PREFACE The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those...
January 1, 1976
Measurement of Small-Signal Transistor Scattering Parameters
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

References

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