JEDEC - EIA-435
Measurement of Small-Signal Transistor Scattering Parameters
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| Organization: | JEDEC |
| Publication Date: | 1 January 1976 |
| Status: | inactive |
| Page Count: | 22 |
scope:
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
Document History
April 1, 1976
Standard for the Measurement of Small-Signal Transistor Scattering Parameters
PREFACE
The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those...
EIA-435
January 1, 1976
Measurement of Small-Signal Transistor Scattering Parameters
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
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