JEDEC JESD 311
Measurement of Transistor Noise Figure at MF, HF, and VHF
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| Organization: | JEDEC |
| Publication Date: | 1 November 1981 |
| Status: | active |
| Page Count: | 26 |
scope:
FOREWORD
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This method is a revision of RS-311 and incorporates material previously found in RS-283, and as such rescinds RS-283 since it was found deficient in test method details and definitions for noise figure measurements. Also, RS-311-A adds the necessary information to make "effective input noise temperature" measurements. The noise definitions are identical to that found in JEDEC Standard No.77 and do not conflict with the IEC documents, found in 47 (Secretariat) 558/548 as approved in Tokyo, June 1975.
Document History
November 1, 1981
Transistor Noise Figure and Effective Input Noise Temperature at MF, HF and VHF, Measurement of
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make...
JEDEC JESD 311
November 1, 1981
Measurement of Transistor Noise Figure at MF, HF, and VHF
FOREWORD
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This method is a revision of RS-311 and...