JEDEC - EIA-311
Transistor Noise Figure and Effective Input Noise Temperature at MF, HF and VHF, Measurement of
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| Organization: | JEDEC |
| Publication Date: | 1 November 1981 |
| Status: | inactive |
| Page Count: | 21 |
scope:
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283. Formerly known as RS-311A and/or EIA-311-A.
Document History
EIA-311
November 1, 1981
Transistor Noise Figure and Effective Input Noise Temperature at MF, HF and VHF, Measurement of
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make...
November 1, 1981
Measurement of Transistor Noise Figure at MF, HF, and VHF
FOREWORD
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This method is a revision of RS-311 and...
References
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