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DLA - DSCC-VID-V62/10608

MICROCIRCUIT, LINEAR, CURRENT SHARING 10 A DC/DC POWER SUPPLY, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 15 July 2010
Status: inactive
Page Count: 19
scope:

This drawing documents the general requirements of a current sharing 10A DC/DC power supply microcircuit, with an operating temperature range of -55°C to +125°C.

Document History

DSCC-VID-V62/10608 REV B
November 14, 2012
MICROCIRCUIT, LINEAR, CURRENT SHARING 10 A DC/DC POWER SUPPLY, MONOLITHIC SILICON
This drawing documents the general requirements of a current sharing 10A DC/DC power supply microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/10608 REV A
November 23, 2010
MICROCIRCUIT, LINEAR, CURRENT SHARING 10 A DC/DC POWER SUPPLY, MONOLITHIC SILICON
This drawing documents the general requirements of a current sharing 10A DC/DC power supply microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/10608
July 15, 2010
MICROCIRCUIT, LINEAR, CURRENT SHARING 10 A DC/DC POWER SUPPLY, MONOLITHIC SILICON
This drawing documents the general requirements of a current sharing 10A DC/DC power supply microcircuit, with an operating temperature range of -55°C to +125°C.

References

This document references:
JEP95 BOOK 1 - Book One Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
PREFACE This Publication contains those solid state product outlines and other associated drawings that have been registered and assigned a JEDEC designation and are printed on white paper. Product...
This document references:
JEP95 BOOK 2 - Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
A description is not available for this item.
This document references:
JEDEC JESD 22-A115 - Electrostatic Discharge (ESD) Sensitivity Testing, Machine Model (MM)
Published by JEDEC on November 1, 2010
This method establishes a standard procedure for testing microcircuits using an electrostatic discharge (ESD) model known commonly in the industry as the Machine Model (MM). The objective is to...
This document references:
JEDEC JESD 78 - IC Latch-Up Test
Published by JEDEC on April 1, 2016
This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for determining IC latch-up characteristics and...
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