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IEC/PAS 62172

Accelerated Moisture Resistance - Unbiased Autoclave

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Organization: IEC
Publication Date: 1 August 2000
Status: inactive
Page Count: 12

Document History

IEC/PAS 62172
August 1, 2000
Accelerated Moisture Resistance - Unbiased Autoclave
A description is not available for this item.

References

This document is replaced by:
IEC 60749-33 - Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Published by IEC on March 1, 2004
Scope and object The unbiased autoclave test is performed to evaluate the moisture resistance integrity of nonhermetic packaged solid-state devices using moisture condensing or moisture saturated...
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