DS/EN 61000-4-20
Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides
active, Most Current
Buy Now
| Organization: | DS |
| Publication Date: | 13 January 2011 |
| Status: | active |
| Page Count: | 82 |
| ICS Code (Electromagnetic compatibility in general): | 33.100.01 |
| ICS Code (Immunity): | 33.100.20 |
| ICS Code (Emission): | 33.100.10 |
scope:
This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.
Document History
DS/EN 61000-4-20
January 13, 2011
Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides
This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include...
July 30, 2007
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines...
May 22, 2003
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
This part of 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of Transverse Electromagnetic (TEM) waveguides. This includes open (for...
Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in Transverse Electromagnetic (TEM) waveguides - Basic EMC publication
A description is not available for this item.
Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in Transverse Electromagnetic (TEM) waveguides
This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include...
Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in Transverse Electromagnetic (TEM) waveguides - Basic EMC publication
A description is not available for this item.
References
Related Products
Searching for related products...