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BSI - BS EN 62132-2

Integrated circuits - Measurement of electromagnetic immunity Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

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Organization: BSI
Publication Date: 30 April 2011
Status: active
Page Count: 28
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS EN 62132-2
April 30, 2011
Integrated circuits - Measurement of electromagnetic immunity Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
A description is not available for this item.

References

This document references:
IEC 60050-131 - AMENDMENT 1 International Electrotechnical Vocabulary – Part 131: Circuit theory
Published by IEC on September 1, 2008
This part of IEC 60050 gives the general terminology used in the theory of electric and magnetic circuits, as well as general terms pertaining to circuit elements and their characteristics, to...
This document references:
IEC 62132-1 - Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
Published by IEC on October 1, 2015
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
This document references:
IEC 60050-161 - Amendment 2 International Electrotechnical Vocabulary Chapter 161: Electromagnetic Compatibility
Published by IEC on April 1, 1998
A description is not available for this item.
This document references:
IEC 61000-4-3 - Electromagnetic compatibility (EMC) – Part 4-3: Testing and measurement techniques – Radiated, radio-frequency electromagnetic field immunity test
Published by IEC on September 1, 2020
This part of IEC 61000 is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test...
This document references:
61000-4-20 - Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Published by IEC on February 1, 2022
This part of IEC 61000 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include...
This document is referenced by:
BS EN 61000-4-20 - Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Published by BSI on March 31, 2011
A description is not available for this item.
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