Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
|Publication Date:||1 October 2015|
|ICS Code (Integrated circuits. Microelectronics):||31.200|
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).