IEC 62132-1
Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
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| Organization: | IEC |
| Publication Date: | 1 October 2015 |
| Status: | active |
| Page Count: | 54 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).
Document History
IEC 62132-1
October 1, 2015
Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
January 1, 2006
Integrated circuits – Measurement of electromagnetic Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz – Part 1: General conditions and definitions
Scope and object
This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and...