DIN EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002
inactive
| Organization: | DIN |
| Publication Date: | 1 September 2002 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
January 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
In diesem Teil der IEC 60749 sind für integrierte Schaltungen sowohl die I-Prüfbeanspruchung als auch die Überspannungs-Prüfbeanspruchung bezüglich des Latch-up-Prüfverfahrens beschrieben.
Dieses...
November 1, 2009
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/2026/CDV:2009); German version FprEN 60749-29:2009
A description is not available for this item.
July 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2003); German version EN 60749-29:2003 + Corrigendum:2004
A description is not available for this item.
DIN EN 60749-29
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002
A description is not available for this item.
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