IEC 63150-1
Semiconductor devices – Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment – Part 1: Arbitrary and random mechanical vibrations
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| Organization: | IEC |
| Publication Date: | 1 May 2019 |
| Status: | active |
| Page Count: | 78 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 63150 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range.
This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.
Document History
IEC 63150-1
May 1, 2019
Semiconductor devices – Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment – Part 1: Arbitrary and random mechanical vibrations
This part of IEC 63150 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters...