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DIN IEC 47D/221/CDV

Semiconductor devices, mechanical standardization - QFP measuring method (IEC 47D/221/CDV:1998)

inactive, Most Current
Organization: DIN
Publication Date: 1 August 1998
Status: inactive
ICS Code (Mechanical structures for electronic equipment): 31.240

Document History

DIN IEC 47D/221/CDV
August 1, 1998
Semiconductor devices, mechanical standardization - QFP measuring method (IEC 47D/221/CDV:1998)
A description is not available for this item.

References

This document is replaced by:
DIN EN 60191-6-3 - Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages; Measuring methods for package dimensions of quat flat packs (QFP) (IEC 60191-6-3:2000); German version EN 60191-6-3:2000
Published by DIN on June 1, 2001
A description is not available for this item.

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