IEEE 1505.1
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505™
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| Organization: | IEEE |
| Publication Date: | 13 June 2019 |
| Status: | active |
| Page Count: | 158 |
scope:
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505™ receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
Purpose
The purpose of this standard is to permit the physical interoperability of IEEE 1505-compliant interface fixtures (also known as interface test adapters, interface devices, or interconnecting devices) on multiple ATE systems utilizing the IEEE 1505 RFI by providing a standardized physical pin map with related connector configuration and contact performance characteristics.
Document History
IEEE 1505.1
June 13, 2019
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505™
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505™ receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and...
December 1, 2015
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...
September 26, 2008
Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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