IEEE 1505.1
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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| Organization: | IEEE |
| Publication Date: | 1 December 2015 |
| Status: | inactive |
| Page Count: | 175 |
scope:
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
Purpose
Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
1 Information on references can be found in Clause 2.
Document History
June 13, 2019
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505™
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505™ receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and...
IEEE 1505.1
December 1, 2015
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...
September 26, 2008
Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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