DIN IEC 60749-35
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 December 2004 |
| Status: | inactive |
| Page Count: | 34 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 60749-35
December 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)
A description is not available for this item.
References
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