DS/EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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| Organization: | DS |
| Publication Date: | 2 May 2011 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
Document History
DS/EN 60749-23
May 2, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
April 29, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
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