scope:

During the kickoff meeting at San Diego for this task group (5/l/95), a vote was taken to determine if the attendees (some 26 members of industry) felt that a revision to the existing appendix D was needed. The group voted unanimously that a revision was required. The two major areas of complaint were: a) there were concerns regarding the lack of a ''uniform'' approach made the testing more costly and delayed implementation for both users and suppliers; and b) the test method didn't address all assembly methods (e.g. ''chip and DIP'' and ''PTH only''). It is the intent of this revision to correct these problems.