DIN IEC 60749-20-1
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling, shipping and use of moisture/reflow sensitive surface mount devices (IEC 47/1775/CD:2004)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 February 2005 |
| Status: | inactive |
| Page Count: | 52 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 60749-20-1
February 1, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling, shipping and use of moisture/reflow sensitive surface mount devices (IEC 47/1775/CD:2004)
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