IEEE 1149.1
Test Access Port andBoundary-Scan Architecture
inactive
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| Organization: | IEEE |
| Publication Date: | 19 August 1996 |
| Status: | inactive |
| Page Count: | 1 |
Document History
February 6, 2013
Test Access Port and Boundary-Scan Architecture
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to:
- Testing the interconnections between integrated circuits once they have been...
June 14, 2001
Standard Test Access Port and Boundary-Scan Architecture
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to
— testing the interconnections between integrated circuits once they have been...
IEEE 1149.1
August 19, 1996
Test Access Port andBoundary-Scan Architecture
A description is not available for this item.
January 1, 1994
Supplement to IEEE Std 1149.1-1990, Standard Test Access Port and Boundary-Scan Architecture
A description is not available for this item.
May 21, 1990
Standard Test Access Port and Boundary-Scan Architecture
A description is not available for this item.