DIN IEC 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error rate testing of electronic components (IEC 47/1796/CD:2004)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 2005 |
| Status: | inactive |
| Page Count: | 18 |
| ICS Code (Electronic component assemblies): | 31.190 |
Document History
DIN IEC 60749-38
April 1, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error rate testing of electronic components (IEC 47/1796/CD:2004)
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