BSI - BS IEC 60747-10
Semiconductor devices - Generic specification for discrete devices and integrated circuits
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| Organization: | BSI |
| Publication Date: | 30 September 1991 |
| Status: | active |
| Page Count: | 38 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
Document History
BS IEC 60747-10
September 30, 1991
Semiconductor devices - Generic specification for discrete devices and integrated circuits
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
References
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