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BSI - BS IEC 60748-11

Harmonized system of quality assessment for electronic components Semiconductor devices - Sectional specification for semiconductor integrated circuits excluding hybrid circuits

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Organization: BSI
Publication Date: 30 September 1991
Status: active
Page Count: 30
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.

Document History

BS IEC 60748-11
September 30, 1991
Harmonized system of quality assessment for electronic components Semiconductor devices - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.
September 30, 1991
Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits. To be read in...

References

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