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BSI - BS IEC 60748-5

Semiconductor Devices - Integrated Circuits Part 5: Semicustom Integrated Circuits

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Organization: BSI
Publication Date: 15 August 1997
Status: active
Page Count: 26
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

To be read in conjunction with IEC 60747-1:1983,IEC 60748-1:1984

Document History

BS IEC 60748-5
August 15, 1997
Semiconductor Devices - Integrated Circuits Part 5: Semicustom Integrated Circuits
To be read in conjunction with IEC 60747-1:1983,IEC 60748-1:1984

References

This document references:
IEC 60748-2 - Semiconductor Devices - Integrated Circuits - Part 2: Digital Integrated Circuits
Published by IEC on December 1, 1997
A description is not available for this item.
This document references:
IEC 60748-3 - Semiconductor Devices Integrated Circuits Part 3: Analogue Integrated Circuits
Published by IEC on January 1, 1986
This amendment has been prepared by sub-committee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices.
This document references:
IEC 60748-4 - Semiconductor Devices - Integrated Circuits - Part 4: Interface Integrated Circuits
Published by IEC on April 1, 1997
A description is not available for this item.
This document references:
IEC 60748-11 - Semiconductor Devices - Integrated Circuits Part 11: Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits
Published by IEC on December 1, 1990
This sectional specification applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.
This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document is referenced by:
BS IEC 60748-11 - Harmonized system of quality assessment for electronic components Semiconductor devices - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Published by BSI on September 30, 1991
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.
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