BSI - BS IEC 60748-11
Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits
inactive
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| Organization: | BSI |
| Publication Date: | 30 September 1991 |
| Status: | inactive |
| Page Count: | 30 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits. To be read in conjunction with BS QC 700000
Document History
September 30, 1991
Harmonized system of quality assessment for electronic components Semiconductor devices - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.
BS IEC 60748-11
September 30, 1991
Harmonized System of Quality Assessment for Electronic Components Semiconductor Devices - Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits. To be read in...
References
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