BSI - BS EN 60749-40
Semiconductor devices - Mechanical and climatic test methods Part 40: Board level drop test method using a strain gauge
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| Organization: | BSI |
| Publication Date: | 30 September 2011 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN 60749-40
September 30, 2011
Semiconductor devices - Mechanical and climatic test methods Part 40: Board level drop test method using a strain gauge
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