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BSI - BS DD IEC/TS 62564-1

Process management for avionics - Aerospace qualified electronic components (AQEC) Part 1: Integrated circuits and discrete semiconductors

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Organization: BSI
Publication Date: 30 September 2011
Status: inactive
Page Count: 24
ICS Code (Production. Production management): 03.100.50
ICS Code (Electronic components in general): 31.020
ICS Code (Aerospace electric equipment and systems): 49.060

Document History

BS PD IEC/TS 62564-1
July 31, 2016
Process management for avionics - Aerospace qualified electronic components (AQEC) Part 1: Integrated circuits and discrete semiconductors
A description is not available for this item.
BS DD IEC/TS 62564-1
September 30, 2011
Process management for avionics - Aerospace qualified electronic components (AQEC) Part 1: Integrated circuits and discrete semiconductors
A description is not available for this item.
BS DD IEC/TS 62564-1
June 30, 2009
Aerospace qualified electronic component (AQEC) - Part 1: Microcircuits
A description is not available for this item.

References

This document references:
IEC 62396-1 - Process management for avionics – Atmospheric radiation effects – Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Published by IEC on January 1, 2016
This part of IEC 62396 is intended to provide guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the...
This document references:
IEC 62668-1 - Process management for avionics – Counterfeit prevention – Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components
Published by IEC on September 1, 2019
This part of IEC 62668 defines requirements for avoiding the use of counterfeit, recycled and fraudulent components used in the aerospace, defence and high performance (ADHP) industries. It also...
This document references:
IEC TS 62686-1 - Process management for avionics – Electronic components for aerospace, defence and high performance (ADHP) applications – Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by IEC on April 1, 2020
This part of IEC 62686, which is a Technical Specification, defines the minimum requirements for general purpose "off the shelf" COTS (commercial off-the-shelf) integrated circuits and discrete...
This document references:
JEDEC JEP 122 - Failure Mechanisms and Models for Semiconductor Devices
Published by JEDEC on September 1, 2016
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only...
This document references:
JEDEC JEP 149 - Application Thermal Derating Methodologies
Published by JEDEC on January 1, 2021
This publication applies to the application of integrated circuits and their associated packages in end use designs. It summarizes the methodology of thermal derating and the suitability of such...
This document references:
JEDEC JEP 149 - Application Thermal Derating Methodologies
Published by JEDEC on January 1, 2021
This publication applies to the application of integrated circuits and their associated packages in end use designs. It summarizes the methodology of thermal derating and the suitability of such...
This document is referenced by:
BS PD IEC TS 62686-1 - Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by BSI on April 30, 2020
A description is not available for this item.
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