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JEDEC JEP 122

Failure Mechanisms and Models for Semiconductor Devices

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Organization: JEDEC
Publication Date: 1 September 2016
Status: active
Page Count: 114
scope:

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method.

The models apply primarily to the following:

a) Aluminum (doped with small amounts of Cu and/or Si) and copper alloy metallization

b) Refractory metal barrier metals with thin anti-reflection coatings

c) Doped silica or silicon nitride interlayer dielectrics, including low-dielectric-constant materials

d) Poly silicon or "salicide" gates (metal-rich silicides such as W, Ni & Co to decrease resistivity)

e) Thin SiO2 gate dielectric

f) Silicon with p-n junction isolation

g) Tin Whisker Growth Kinetics

h) Printed Circuit Board Ionic Mobility

Document History

JEDEC JEP 122
September 1, 2016
Failure Mechanisms and Models for Semiconductor Devices
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only...
October 1, 2011
Failure Mechanisms and Models for Semiconductor Devices
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only...
November 1, 2010
Failure Mechanisms and Models for Semiconductor Devices
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only...
March 1, 2009
Failure Mechanisms and Models for Semiconductor Devices
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only...
October 1, 2008
Failure Mechanisms and Models for Semiconductor Devices
A description is not available for this item.
March 1, 2006
Failure Mechanisms and Models for Silicon Semiconductor Devices
A description is not available for this item.
August 1, 2003
Failure Mechanisms and Models for Silicon Semiconductor Devices
A description is not available for this item.
December 1, 2001
Failure Mechanisms and Models for Silicon Semiconductor Devices
A description is not available for this item.
January 1, 1996
Failure Mechanisms and Models for Silicon Semiconductor Devices
A description is not available for this item.

References

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