JEDEC JESD 22-A101
Steady-State Temperature-Humidity Bias Life Test
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| Organization: | JEDEC |
| Publication Date: | 1 July 2015 |
| Status: | active |
| Page Count: | 12 |
scope:
The Steady-State Temperature-Humidity
Document History
January 1, 2021
Steady-State Temperature-Humidity Bias Life Test
The Steady-State Temperature-Humidity Bias Life Test is performed to evaluate the reliability of non-hermetic packaged IC devices in humid environments. Temperature, humidity, and bias conditions are...
JEDEC JESD 22-A101
July 1, 2015
Steady-State Temperature-Humidity Bias Life Test
The Steady-State Temperature-Humidity Bias Life Test is performed to evaluate the reliability of nonhermetic packaged IC devices in humid environments. Temperature, humidity, and bias conditions are...
March 1, 2009
Steady State Temperature Humidity Bias Life Test
This standard establishes a defined method and conditions for performing a temperature humidity life test with bias applied. The test is used to evaluate the reliability of non-hermetic packaged...
April 1, 1997
Steady-State Temperature Humidity Bias Life Test
A description is not available for this item.
July 1, 1988
Steady-State Temperature Humidity Bias Life Test (Revision of Test Method A101 - Previously Published in JESD22-B)
A description is not available for this item.