UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

ASTM F24

Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces

active, Most Current
Buy Now
Organization: ASTM
Publication Date: 1 April 2020
Status: active
Page Count: 4
ICS Code (Properties of surfaces): 17.040.20
scope:

This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (633 % of the average of two runs) should be expected for replicate counts on the same sample.

Units-The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Document History

ASTM F24
April 1, 2020
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
April 1, 2009
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
April 1, 2009
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
September 1, 2004
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 µm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
May 10, 2000
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
This method covers the size distribution analysis of particulate contamination, 5 µm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
August 31, 1965
STANDARD METHOD FOR MEASURING AND COUNTING PARTICULATE CONTAMINATION ON SURFACES (R 1983)
A description is not available for this item.

References

Advertisement