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DOD - DSCC-DWG-85092

RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS

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Organization: DOD
Publication Date: 11 December 2019
Status: inactive
Page Count: 8
scope:

Scope.

This drawing establishes the complete requirements for a family of sealed, solid-state relays, supplied to "Y" screening requirements of MIL-PRF-28750.

intended Use:

Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM... View More

Document History

DSCC-DWG-85092
April 7, 2020
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DSCC-DWG-85092
December 11, 2019
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DSCC-DWG-85092
February 20, 2014
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DSCC-DWG-85092
November 29, 2007
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DSCC-DWG-85092 REV E
October 1, 2002
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
A description is not available for this item.
DSCC-DWG-85092 REV D
March 2, 2000
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DESC-DWG-85092 REV C
May 7, 1992
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
Relays conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DESC-DWG-85092 REV B
December 27, 1988
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
A description is not available for this item.
DESC-DWG-85092 REV A
August 24, 1987
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
A description is not available for this item.
DESC-DWG-85092
August 19, 1985
RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
A description is not available for this item.
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References

This document references:
MIL-PRF-28750 - RELAYS, SOLID-STATE, GENERAL SPECIFICATION FOR
Published by NPFC on May 6, 2019
A description is not available for this item.
This document references:
MIL-STD-202-204 - TEST METHOD STANDARD METHOD 204, VIBRATION, HIGH FREQUENCY
Published by NPFC on April 18, 2015
Purpose. The high frequency vibration test is performed for the purpose of determining the effect on component parts of vibration in the frequency ranges of 10 to 500 hertz (Hz), 10 to 2,000 Hz or 10...
This document references:
MIL-STD-202-213 - Method 213, Shock (Specified Pulse)
Published by NPFC on January 22, 2020
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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