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DLA - MIL-STD-750-1A CHANGE 3

TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999

active, Most Current
Organization: DLA
Publication Date: 15 November 2019
Status: active
Page Count: 177
scope:

Purpose.

Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Numbering system.

The test methods are designated by numbers assigned in accordance with the following system:

Classification of tests.

The environmental test methods included in this part of a multipart test method standard are numbered 1001 to 1081 inclusive.

Test method revisions.

Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 1001.2 designates the second revision of test method 1001.

intended Use:

The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More

Document History

MIL-STD-750-1A CHANGE 3
November 15, 2019
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
August 12, 2016
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
December 11, 2015
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
December 11, 2015
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
A description is not available for this item.
April 24, 2015
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
August 22, 2014
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
October 1, 2013
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
July 1, 2013
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
March 11, 2013
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...
January 3, 2012
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural...

References

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