DLA - MIL-STD-750-1A CHANGE 3
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
|Publication Date:||15 November 2019|
Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
The test methods are designated by numbers assigned in accordance with the following system:
Classification of tests.
The environmental test methods included in this part of a multipart test method standard are numbered 1001 to 1081 inclusive.
Test method revisions.
Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 1001.2 designates the second revision of test method 1001.
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field. This test method standard has been prepared to provide uniform test methods, controls, and procedures for determining with predictability the suitability of such devices within military, aerospace and special application equipment.View Less