scope:

Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Numbering system. The test methods are designated by numbers assigned in accordance with the following system:

Classification of tests. The environmental test methods included in this part of a multipart test method standard are numbered 1001 to 1081 inclusive.

Test method revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 1001.2 designates the second revision of test method 1001.