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NPFC - MIL-STD-883-4

TEST METHOD STANDARD ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS PART 4: TEST METHODS 4000-4999

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Organization: NPFC
Publication Date: 16 September 2019
Status: active
Page Count: 43
scope:

Purpose.

Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.

Numbering system.

The test methods are designated by numbers assigned in accordance with the following system:

Classification of tests.

The electrical test methods included in this part of a multipart test method standard are numbered 4001 to 4007 inclusive.

Test method revisions.

Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 4001.2 designates the second revision of test method 4001.

intended Use:

The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More

Document History

MIL-STD-883-4
September 16, 2019
TEST METHOD STANDARD ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS PART 4: TEST METHODS 4000-4999
Purpose. Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions...

References

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