IEC 60747-5-9
Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
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| Organization: | IEC |
| Publication Date: | 1 December 2019 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 60747 specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the relative external quantum efficiencies (EQEs) measured at cryogenic temperatures and at an operating temperature, which is called temperature-dependen
Document History
IEC 60747-5-9
December 1, 2019
Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
This part of IEC 60747 specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting...