IEC 60747-5-11
Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes
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| Organization: | IEC |
| Publication Date: | 1 December 2019 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 60747 specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.
Document History
IEC 60747-5-11
December 1, 2019
Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes
This part of IEC 60747 specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting...