AENOR - UNE-EN 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
inactive
| Organization: | AENOR |
| Publication Date: | 2 November 2005 |
| Status: | inactive |
| Page Count: | 35 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
December 21, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
UNE-EN 60749-30
November 2, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.