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DOD - SMD 5962-00540

MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 21 July 2020
Status: active
Page Count: 54
scope:

Scope.

This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More

Document History

SMD 5962-00540
July 21, 2020
MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-00540
November 27, 2007
MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-00540
November 4, 2005
MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-00540
November 22, 2004
MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD 5962-00540
April 23, 2003
MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD 5962-00540
August 2, 2001
MICROCIRCUIT, DIGITAL, 32-BIT SPARC PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published by ASTM on October 1, 2011
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
This document references:
IEEE 1149.1 - Test Access Port and Boundary-Scan Architecture
Published by IEEE on February 6, 2013
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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