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BSI - BS EN IEC 62433-6

EMC IC modelling Part 6: Models of integrated circuits for Pulse immunity behavioural simulation — Conducted Pulse Immunity (ICIM-CPI)

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Organization: BSI
Publication Date: 30 November 2020
Status: active
Page Count: 60
ICS Code (Integrated circuits. Microelectronics): 31.200
ICS Code (Emission): 33.100.10

Document History

BS EN IEC 62433-6
November 30, 2020
EMC IC modelling Part 6: Models of integrated circuits for Pulse immunity behavioural simulation — Conducted Pulse Immunity (ICIM-CPI)
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References

This document references:
EN 55017 - Methods of measurement of the suppression characteristics of passive EMC filtering devices
Published by CENELEC on September 1, 2011
This International standard specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The...
This document references:
EN 61000-4-2 - Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
Published by CENELEC on March 1, 2009
This part of IEC 61000 relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and from...
This document references:
EN 61000-4-4 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
Published by CENELEC on November 1, 2012
This part of IEC 61000 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to...
This document references:
EN 62215-3 - Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Published by CENELEC on October 1, 2013
This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily...
This document references:
EN 62433-2 - EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Published by CENELEC on May 1, 2017
This part of IEC 62433 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated...
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