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CENELEC - EN 62215-3

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

active, Most Current
Organization: CENELEC
Publication Date: 1 October 2013
Status: active
Page Count: 36
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

Document History

EN 62215-3
October 1, 2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily...

References

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