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BSI - BS EN IEC 62435-7

Electronic components — Long-term storage of electronic semiconductor devices Part 7: Micro-electromechanical devices

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Organization: BSI
Publication Date: 31 January 2021
Status: active
Page Count: 26
ICS Code (Electronic components in general): 31.020

Document History

BS EN IEC 62435-7
January 31, 2021
Electronic components — Long-term storage of electronic semiconductor devices Part 7: Micro-electromechanical devices
A description is not available for this item.

References

This document references:
EN 62435-2 - Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Published by CENELEC on April 1, 2017
This part of IEC 62435 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes...
This document references:
EN 62435-5 - Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Published by CENELEC on March 1, 2017
This part of IEC 62435, is applicable to long-term storage of die and wafer devices and establishes specific storage regimen and conditions for singulated bare die and partial or complete wafers of...
This document references:
EN IEC 60721-3-1 - Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage
Published by CENELEC on April 1, 2018
This part of IEC 60721 classifies the groups of environmental parameters and their severities to which products together with their packaging, if any, are subjected when stored. The environmental...
This document references:
EN IEC 60749-20 - Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Published by CENELEC on October 1, 2020
This part of IEC 60749 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive.
This document references:
EN IEC 62435-3 - Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Published by CENELEC on April 1, 2020
This part of IEC 62435 describes the aspects of data storage that are necessary for successful use of electronic components being stored after long periods while maintaining traceability or chain of...
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