ECIA - EIA-970
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
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| Organization: | ECIA |
| Publication Date: | 1 July 2013 |
| Status: | active |
| Page Count: | 23 |
scope:
This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
Document History
EIA-970
July 1, 2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
July 1, 2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.