UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

ECIA - EIA-970

Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

inactive
Buy Now
Organization: ECIA
Publication Date: 1 July 2013
Status: inactive
Page Count: 26
scope:

This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.

Document History

EIA-970
July 1, 2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
EIA-970
July 1, 2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
Advertisement