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ITU-T K.147

Ethernet port resistibility testing for overvoltages and overcurrents Corrigendum 1

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Organization: ITU-T
Publication Date: 1 January 2021
Status: active
Page Count: 46
scope:

This Recommendation provides the rational for the Ethernet port testing found in [ITU-T K.20], [ITU-T K.21], [ITU-T K.44], [ITU-T K.45] and [ITU-T K.117]. Topics covered are:

• IEEE 802.3 Ethernet;

• IEEE Ethernet configurations;

- Data only

- Power over Ethernet (PoE), and power over data line (PoDL);

• overvoltage and overcurrent events coupling into the Ethernet system;

• lightning surge resistibility test circuit approaches;

• power fault resistibility test circuit approaches;

• resistibility test circuit applicability to [ITU-T K.20], [ITU-T K.21], [ITU-T K.44], [ITU-T K.45] and [ITU-T K.117].

Document History

ITU-T K.147
January 1, 2021
Ethernet port resistibility testing for overvoltages and overcurrents Corrigendum 1
This Recommendation provides the rational for the Ethernet port testing found in [ITU-T K.20], [ITU-T K.21], [ITU-T K.44], [ITU-T K.45] and [ITU-T K.117]. Topics covered are: • IEEE 802.3 Ethernet;...
June 1, 2020
Ethernet port resistibility testing for overvoltages and overcurrents
This Recommendation provides the rational for the Ethernet port testing found in [ITU-T K.20], [ITU-T K.21], [ITU-T K.44], [ITU-T K.45] and [ITU-T K.117]. Topics covered are: • IEEE 802.3 Ethernet;...

References

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