ITU-T K.147
Ethernet port resistibility testing for overvoltages and overcurrents Corrigendum 1
Organization: | ITU-T |
Publication Date: | 1 January 2021 |
Status: | active |
Page Count: | 46 |
scope:
This Recommendation provides the rational for the Ethernet port testing found in [ITU-T K.20], [ITU-T K.21], [ITU-T K.44], [ITU-T K.45] and [ITU-T K.117]. Topics covered are:
• IEEE 802.3 Ethernet;
• IEEE Ethernet configurations;
- Data only
- Power over Ethernet (PoE), and power over data line (PoDL);
• overvoltage and overcurrent events coupling into the Ethernet system;
• lightning surge resistibility test circuit approaches;
• power fault resistibility test circuit approaches;
• resistibility test circuit applicability to [ITU-T K.20], [ITU-T K.21], [ITU-T K.44], [ITU-T K.45] and [ITU-T K.117].