CENELEC - EN IEC 61967-4
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 April 2021 |
| Status: | active |
| Page Count: | 50 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.
Document History
EN IEC 61967-4
April 1, 2021
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
June 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
A description is not available for this item.
June 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHZ to 1 GHz Part 4: Measurement of Conducted Emissions - 1 ohm/150 ohm Direct Coupling Method
A description is not available for this item.
June 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
A description is not available for this item.