CEI - EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods Part 41: Standard reliability testing methods of non-volatile memory devices
active, Most Current
| Organization: | CEI |
| Publication Date: | 1 May 2021 |
| Status: | active |
| Page Count: | 30 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
Document History
EN IEC 60749-41
May 1, 2021
Semiconductor devices - Mechanical and climatic test methods Part 41: Standard reliability testing methods of non-volatile memory devices
This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention...