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DLA - SMD-5962-84046 REV J

MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 18 June 2021
Status: active
Page Count: 13
scope:

Scope.

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More

Document History

SMD-5962-84046 REV J
June 18, 2021
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead...
SMD 5962-84046
September 23, 2015
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-84046
September 17, 2009
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-84046 REV F
February 8, 2002
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-84046 REV D
November 19, 1999
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD-5962-84046 REV C
March 24, 1989
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
JEDEC JESD 7 - 54/74HCXXXX and 54/74HCTXXXX High Speed CMOS Devices, Description of
Published by JEDEC on January 1, 1986
This standard provides uniformity, multiplicity of sources, eliminate confusion, and ease of device specification and design by users for HC, and HCT CMOS devices. This standard specifies electrical...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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