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DLA - DSCC-VID-V62/21608

MICROCIRCUIT, LINEAR, LOW QUIESCENT CURRENT IDEAL DIODE CONTROLLER, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 26 August 2021
Status: active
Page Count: 14
scope:

Scope.

This drawing documents the general requirements of a high performance low quiescent current (IQ) ideal diode controller microcircuit, with an operating temperature range of -55ºC to +125ºC.

Document History

DSCC-VID-V62/21608
August 26, 2021
MICROCIRCUIT, LINEAR, LOW QUIESCENT CURRENT IDEAL DIODE CONTROLLER, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance low quiescent current (IQ) ideal diode controller microcircuit, with an operating temperature range of -55ºC to +125ºC.

References

This document references:
JS-002 - Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
Published by ESD on April 6, 2022
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a...
This document references:
JEDEC JEP 155 - Recommended ESD Target Level for HBM Qualification
Published by JEDEC on July 1, 2018
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP95 BOOKS 1-3/95-1 - Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
A description is not available for this item.
This document references:
JS-001 - Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Device Level
Published by JEDEC on May 1, 2023
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a...
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