JEDEC - JEP121B
Requirements for Microelectronic Screening and Test Optimization
| Organization: | JEDEC |
| Publication Date: | 1 September 2020 |
| Status: | active |
| Page Count: | 41 |
scope:
This document defines the methodology for the optimization (elimination, reduction, or alternative approach) of the screening and testing requirements for MIL-PRF-38535 Microcircuits. Inherent in this methodology is the application of "In-line Process Controls" and "SPC" techniques to the applicable manufacturing processes. This document includes the process for initial approval and subsequent maintenance of the testing and screening optimizations.
The purpose of this document provides the basis for the optimization of 100% screening operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
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