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JEDEC JEP 121

Guidelines for MIL-STD-883, Screening and QCI Optimization

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Organization: JEDEC
Publication Date: 1 April 1995
Status: inactive
Page Count: 98

Document History

September 1, 2020
Requirements for Microelectronic Screening and Test Optimization
This document defines the methodology for the optimization (elimination, reduction, or alternative approach) of the screening and testing requirements for MIL-PRF-38535 Microcircuits. Inherent in...
October 1, 2006
Requirements for Microelectronic Screening and Test Optimization
The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in...
JEDEC JEP 121
April 1, 1995
Guidelines for MIL-STD-883, Screening and QCI Optimization
A description is not available for this item.
January 1, 1995
Guidelines for MIL-STD-883 Screening and QCI Optimization
A description is not available for this item.
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